Unable to find any suggestions for your query...
Lu, Y., Chen, X., Zhai, X., Saha, S., Ehsan, S., Su, J. and McDonald-Maier, K., (2021). A Fast Simulation Method for Analysis of SEE in VLSI. Microelectronics Reliability. 120, 114110-114110
Lu, Y., Zhai, X., Saha, S., Ehsan, S. and McDonald-Maier, K., (2020). A self-scrubbing scheme for embedded systems in radiation environments